Semiconductor Engineering

High-Throughput Image Sensors: Smart Testing Powers Progress

As data streams grow, modern ATE ensures flexible, scalable accuracy.
Tech Xplore on MSN

Image-based model enhances the detection of surface defects in low-light industrial settings

In industry, the detection of anomalies such as scratches, dents, and discolorations is crucial to ensure product quality and safety. However, conventional methods rely on heavy computational ...
Semiconductor Engineering

Using Automatic Defect Classification To Reduce The Escape Rate Of Defects

Automated optical inspection (AOI) is a cornerstone in semiconductor manufacturing, assembly and testing facilities, and as such, it plays a crucial role in yield management and process control.
Electronic Design

Synopsys addresses FinFET defects, embedded-flash test at ITC

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...
Electronic Design

X-Ray Inspection System Weeds Out Defects

Tailored to industrial, automotive, and medical applications, the Verifier H Series horizontal-beam, x-ray inspection system provides manufacturing-quality assessment and defect detection of ...