News
The electron microscope is a type of microscope that uses a beam of electrons to ... This example highlights the benefits of imaging in variable pressure secondary electron mode.
As the EMF diversified in both the disciplines it served and the types of microscopy it supported, the title of "Electron Microscopy" was no longer appropriate, and the facility was renamed as the ...
The 3D electron microscopy imaging is available using Serial Block Face (SB-EM) and Focused Ion Beam Scanning Electron Microscopy (FIB-SEM) or Electron Tomography (ET) Electron tomography is TEM based ...
WHITE PLAINS, N.Y., April 22, 2025 /CNW/ -- ZEISS announces the introduction of its highly flexible and efficient software suite, ZEN core, for operating all ZEISS scanning electron microscopes (SEMs) ...
ZEISS EVO series combines high definition Scanning Electron Microscopy with high throughput automated workflow. Experience excellence in extended pressure mode imaging, thanks to the latest ...
Users can easily access essential electron microscopy (EM ... and sophisticated functions for correlative microscopy, suitable for all types of imaging systems as it can process data from ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results