Researchers at Istituto Italiano di Tecnologia (IIT-Italian Institute of Technology) have developed an innovative microscopy ...
The left side illustrates a schematic of electric field observation of the space charge layer at the grain boundary. An electron beam tilted at various angles (tilt-scan-averaged electron beam) scans ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback