Many chipmakers face a difficult trade-off — improve quality without affecting yield. Traditional testing methods fail to navigate this challenge due to their limited visibility below the pass/fail ...
isixsigma on MSN
A Step-by-Step Guide: How to Calculate Your Process Sigma
How do you calculate your Process Sigma? Determining the lowest acceptable defect rate in your production is a way to ...
Processors AMD claims Intel's CES comparisons are 'not even a fair fight'; Intel says AMD is 'selling ancient silicon'—but they're both guilty of using confusing tactics Processors Intel says its ...
This article is the second in a series from PDF Solutions on why adopting big data platforms will transform the compound semiconductor industry. The first part “Accelerating silicon carbide (SiC) ...
Semiconductor wafer defect pattern recognition and classification is a crucial area of research that underpins yield enhancement and quality assurance in microelectronics manufacturing. The discipline ...
In addition to surface and subsurface defects, residual stress represents a concern. Over time, these stress points, ...
The big picture: During his tenure as Intel's CEO, Pat Gelsinger sought to correct a critical strategic misstep that allowed TSMC to surpass Intel in process technology. Gelsinger promised that ...
Portable 3D optical inspection with 4Di InSpec transforms surface metrology, enhancing defect detection and quality assurance ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback